Index | Element | I.S. |  Z  | Conf. | Level | ¡÷E (eV) | Method | Ref. | |
1 | Xe | Cu | 54 | 855.8471 | THR | R358 | |||
2 | Xe | Cu | 54 | 855.8719 | SEM | R358 | |||
3 | Xe | Cu | 54 | 857.029 | 3.7E-01 | EXP | R358 | ||
4 | Xe | Cu | 54 | 857.487 | SEM1 | R358 | |||
5 | Xe | Cu | 54 | 4S | 2S1/2 | 857 | 0.4 | EXP | R499 |
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'I.S.' ---------- the isoelectronic sequence
'Z' ---------- atomic number
'Conf.' ---------- configuration
'Level' ---------- the notation of energy level
'E' ---------- the ionization potential
'¡÷E' ---------- error for ionization potential
'Method' ---------- the method by which the data is produced
'Ref.' ---------- the reference