Index | Element | I.S. |  Z  | Conf. | Level | ¡÷E (eV) | Method | Ref. | |
1 | Si | Be | 14 | 1S22S2 | 476.08 | COMP | R1 | ||
2 | Si | Be | 14 | 1S22S2 | 476.36 | +2.E-2 | EXP | R16 | |
3 | Si | Be | 14 | 1S22S2 | 476.561 | +4.8E-2 | THR | R10 | |
4 | Si | Be | 14 | 2S2 | 1S0 | 476.0747 | COMP | R400 | |
5 | Si | Be | 14 | 2s2 | 1S0 | 476.31363 | THR | R419 |
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'I.S.' ---------- the isoelectronic sequence
'Z' ---------- atomic number
'Conf.' ---------- configuration
'Level' ---------- the notation of energy level
'E' ---------- the ionization potential
'¡÷E' ---------- error for ionization potential
'Method' ---------- the method by which the data is produced
'Ref.' ---------- the reference