Index | Element | I.S. |  Z  | Conf. | Level | ¡÷E (eV) | Method | Ref. | |
1 | S | Si | 16 | 3P2 | 3P0 | 34.82717 | COMP | R400 | |
2 | S | Si | 16 | 3P2 | 3P0 | 34.826 | COMP | R325 |
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'I.S.' ---------- the isoelectronic sequence
'Z' ---------- atomic number
'Conf.' ---------- configuration
'Level' ---------- the notation of energy level
'E' ---------- the ionization potential
'¡÷E' ---------- error for ionization potential
'Method' ---------- the method by which the data is produced
'Ref.' ---------- the reference