Index | Element | I.S. |  Z  | Conf. | Level | ¡÷E (eV) | Method | Ref. | |
1 | Mo | Cu | 42 | 4S | 2S1/2 | 300.8515 | SEM | R358 | |
2 | Mo | Cu | 42 | 4S | 2S1/2 | 302.596 | 3.7E-02 | EXP | R358 |
3 | Mo | Cu | 42 | 4S | 2S1/2 | 302.571 | SEM1 | R358 | |
4 | Mo | Cu | 42 | 4S | 2S1/2 | 302.6 | 0.04 | COMP | R405 |
¡¾Close¡¿
'I.S.' ---------- the isoelectronic sequence
'Z' ---------- atomic number
'Conf.' ---------- configuration
'Level' ---------- the notation of energy level
'E' ---------- the ionization potential
'¡÷E' ---------- error for ionization potential
'Method' ---------- the method by which the data is produced
'Ref.' ---------- the reference